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Ensights

Science that is transforming lives and enabling the future

Connecting Automotive and Semiconductor Supply Chains to Drive Functional Safety Excellence

Connecting Automotive and Semiconductor Supply Chains to Drive Functional Safety Excellence

Electronic devices now serve as the backbone of modern vehicles and have become the focus of quality standards that ensure automotive functional safety. As automakers transform their organizations to adapt and become experts in manufacturing digital machines, current gaps in how the automotive and semiconductor supply chains interact have emerged.

High Purity PFA Tubing Overcomes PVC Pitfalls in Dual Containment Systems

A high purity sub-fab serves as the central nervous system of a semiconductor cleanroom. It houses chemical delivery, purification, recycling, and destruction systems. The sub-fab is where potentially hazardous aqueous chemistries and gases are stored and handled until they are delivered to the cleanroom process equipment located either in the floor above it or the building adjacent to it.

Yield Advantages Through Maintaining and Upgrading FOUP Populations

One of the longest held beliefs in semiconductor manufacturing is that yield is the single most important factor in overall wafer processing costs. Even incremental yield increases can significantly reduce manufacturing cost per wafer, or cost per square centimeter of silicon. As such, yield improvement is critical to any successful semiconductor operation. As semiconductor device nodes continue to scale, and 7 nm lines are ramping to production, this belief continues to ring true.

Synergistic CMP Systems Improve Yield

Shrinking feature size, advances in interconnect metals, and the need for ever tighter defectivity control all point to the growing importance of chemical mechanical planarization (CMP) to optimize fab yields. More layers of each chip require CMP to achieve planarity specifications, and contamination must be kept to a minimum.

Examining Chip Manufacturing Challenges for Advanced Logic Architecture

The Fourth Industrial Revolution is surrounding us with extraordinary technologies that did not exist a few years ago. Autonomous vehicles are already being tested on public streets. Drones range from simple adolescent playthings to short- and long-range military and civilian purposes like surveying landforms, shooting movies, and delivering packages. Vast amounts of video content, created by professionals and amateurs alike, are being filmed, streamed, and stored. Surveillance, both fixed and mobile, is becoming commonplace, server farms are bigger than ever, and 4G networks are being supplemented or replaced with 5G. What all these trends have in common is that they generate enormous amounts of data that must be processed, transported, and stored faster and more reliably than ever before.

Advanced CMP of Silicon Carbide Supports an Expanding EV Market

The electric vehicle (EV) market is expanding in response to customer demand, with multiple major automotive companies offering lower cost models with longer driving range.

Precision Engineered Techniques for Coating Plasma Chamber Components

Migration from 2D to 3D structures for high-density memory devices changes the nature of etching and deposition processes, especially as the number of layers for 3D NAND integration grows to 96 and beyond, and new process chemistries become commonplace. The greater number of lengthy processing steps and high aspect ratio (HAR) features involved place new demands on all steps of the chip manufacturing process, including etching, deposition, and cleaning equipment. Consistent process stability becomes harder to achieve.

Transitioning from Predictable to Pervasive Defectivity

Most equipment and process engineers become experts at analyzing a wafer map to quickly identify signatures indicating when their equipment or process was the perpetrator of a maverick yield event. But as defect signatures become more subtle and harder to quickly identify, there is a significant need to consider not just what in-line inspection systems are identifying, but specifically what they are not identifying.

Solving Defect Challenges in the EUV Process

The drive for ever more powerful microprocessors and greater memory storage places demands on all steps of the semiconductor wafer fabrication process. At some point, incremental improvements are no longer sufficient, and further device shrinking requires a completely different technology. The semiconductor industry is now experiencing this with lithography, where extreme ultraviolet (EUV) lithography is replacing 193 nm immersion (193i) lithography for more and more critical chip layers.

  • September 15, 2020

Developing Advanced Deposition Materials: A Recipe for Success

NEW PARADIGMS IN MATERIALS DEPOSITION FOR BOTH LOGIC AND MEMORY DEVICE MANUFACTURING We live in an increasingly connected world that has developed an almost unquenchable thirst for data. To process this raw data into something that is actionable requires the most advanced artificial intelligence (AI) chips for a multitude of applications, from machine learning and autonomous vehicles, to smart cities and efficient energy sources. The quest to develop these devices is driving integrated device manufacturers (IDMs) to push semiconductor manufacturing technology to its very limits.

Wrapping up the First Ever SEMICON West 2020 Virtual Event

Entegris recently wrapped up an exciting week at the first-ever SEMICON West virtual event. The event provided a great opportunity to connect with the community and gain valuable insight into the future of the industry.

Pump it Up: Photochemical Delivery that Meets the Challenges of 3D Architectures

Photochemicals are playing an increasingly important role in bringing next generation devices to reality. While semiconductor manufacturing has always needed a pure, contamination-free environment, the requirements are tightening even further.

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